Paper
1 August 1991 Reflectance stability analysis of Spectralon diffuse calibration panels
Carol J. Bruegge, Albert E. Stiegman, Daniel R. Coulter, Robert R. Hale, David J. Diner, Arthur W. Springsteen
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Abstract
The Multi-angle Imaging SpectroRadiometer (MISR) plans to use deployable diffuse reflectance panels to provide periodic radiometric calibrations of its nine cameras while in-flight. Near-Lambertian reflectance characteristics are desirable to facilitate flat-field camera intercomparisons. Also required is panel spatial and spectral uniformity, and stability with time. Spectralon, a commercially available polytetrafluoroethylene (PTFE) compound, has been baselined in the MISR design. To assess the suitability of this material, a series of degradation tests were planned and implemented. These included UV vacuum exposure and proton bombardment tests which simulated the exposure levels to be encountered during the mission life. Proton levels are now considered too low to be of concern, but UV vacuum tests demonstrate sensitivity to material contamination. Material investigations have concluded that hydrocarbons are present in the bulk of the material, and that plastic packaging materials can introduce additional surface-layer contamination. It is found however, that these unwanted elements can be eliminated through vacuum pumping at elevated temperatures. Exposure to a UV source, while in vacuum, is again planned for a set of targets which have been vacuum baked. This will assess the stability of the pure PTFE form.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Carol J. Bruegge, Albert E. Stiegman, Daniel R. Coulter, Robert R. Hale, David J. Diner, and Arthur W. Springsteen "Reflectance stability analysis of Spectralon diffuse calibration panels", Proc. SPIE 1493, Calibration of Passive Remote Observing Optical and Microwave Instrumentation, (1 August 1991); https://doi.org/10.1117/12.46691
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Cited by 8 scholarly publications and 7 patents.
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KEYWORDS
Reflectivity

Calibration

Ultraviolet radiation

Cameras

Diodes

Contamination

Microwave radiation

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