White light interferometer for measuring polarization extinction ratio

James P. Waters; Daniel J. Fritz

doi:10.1117/12.135287

1 January 1992 White light interferometer for measuring polarization extinction ratio

James P. Waters, Daniel J. Fritz

Proceedings Volume 1553, Laser Interferometry IV: Computer-Aided Interferometry; (1992) https://doi.org/10.1117/12.135287
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

A white light interferometer was developed for measuring polarization extinction ratios in proton-exchanged, integrated-optic (IO) chips. Usually, such measurements require expensive strain-free polarization components. The instrument which was developed at United Technologies Research Center measured extinction ratios in excess of 95 dB using only interferometric quality optics. The system used a superluminescent diode operating at 825 nanometers as the illumination source and two interferometers combined in series, a measurement interferometer and an analyzing interferometer. The measurement interferometer relied upon the two axes of polarization in the IO chip having different optical pathlengths and the analyzing interferometer was a modified Mach-Zehnder. Results using this system on the IO chips showed that the extinction ratio was 58 dB.

Citation Download Citation

James P. Waters and Daniel J. Fritz "White light interferometer for measuring polarization extinction ratio", Proc. SPIE 1553, Laser Interferometry IV: Computer-Aided Interferometry, (1 January 1992); https://doi.org/10.1117/12.135287

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