Paper
13 August 1992 Effect of laser pulse width on overwrite cycle characteristics of phase-change disk media
Takeo Ohta, Kazuo Inoue, Tetsuya Akiyama, Kazumi Yoshioka
Author Affiliations +
Proceedings Volume 1663, Optical Data Storage; (1992) https://doi.org/10.1117/12.137573
Event: Optical Data Storage Topical Meeting, 1992, San Jose, CA, United States
Abstract
It is found that an equivalent temperature profile and mark size produces one million cycle stable overwrite characteristics. The linear velocity at constant angular velocity (CAV) disk rotation mode varies by a factor of two between the outermost track and the innermost track. Varying the laser pulse width can achieve an equivalent mark formation process at both inner and outer track positions. The configuration of the phase change disk media features a quadrilayer rapid cooling structure. Our disk has a new structure, consisting of a dielectric layer combination of a ZnS-SiO2 mixture layer and an SiO2 layer. The equivalent thermal profile was determined using a heating and cooling process simulation method. A large pulse width of 70 ns on the inner track gives the equivalent temperature profile of a smaller 50 ns pulse width on the outer track. This method produces million-cycle-overwrite characteristics through the whole linear velocity range on the disk in a large capacity MCAV system.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Takeo Ohta, Kazuo Inoue, Tetsuya Akiyama, and Kazumi Yoshioka "Effect of laser pulse width on overwrite cycle characteristics of phase-change disk media", Proc. SPIE 1663, Optical Data Storage, (13 August 1992); https://doi.org/10.1117/12.137573
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CITATIONS
Cited by 6 scholarly publications and 1 patent.
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KEYWORDS
Pulsed laser operation

Dielectrics

Crystals

Optical tracking

Modulation

Optical storage

Laser marking

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