Ridge waveguide analysis for integrated optoelectronic devices

Richard S. Burton; Tuviah E. Schlesinger; Donald J. Holmgren; Stephen C. Smith; Robert D. Burnham

doi:10.1117/12.60470

1 July 1992 Ridge waveguide analysis for integrated optoelectronic devices

Richard S. Burton, Tuviah E. Schlesinger, Donald J. Holmgren, Stephen C. Smith, Robert D. Burnham

Proceedings Volume 1679, Physics and Simulation of Optoelectronic Devices; (1992) https://doi.org/10.1117/12.60470
Event: Semiconductors '92, 1992, Somerset, NJ, United States

Abstract

The effective index method has been used to calculate eigenmodes of A1GaAs optical waveguides to determine optimal process parameters for their fabrication and to compare the advantages and disadvantages of several different fabrication technologies for the integration of waveguides and lasers.

Citation Download Citation

Richard S. Burton, Tuviah E. Schlesinger, Donald J. Holmgren, Stephen C. Smith, and Robert D. Burnham "Ridge waveguide analysis for integrated optoelectronic devices", Proc. SPIE 1679, Physics and Simulation of Optoelectronic Devices, (1 July 1992); https://doi.org/10.1117/12.60470

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