Off-line real-time FTIR analysis of a process step in imipenem production

Jhansi R. Boaz; Scott M. Thomas; Steven M. Meyerhoffer; Steven J. Staskiewicz; Joseph E. Lynch; Richard S. Egan; Dean K. Ellison

doi:10.1117/12.137752

14 August 1992 Off-line real-time FTIR analysis of a process step in imipenem production

Jhansi R. Boaz, Scott M. Thomas, Steven M. Meyerhoffer, Steven J. Staskiewicz, Joseph E. Lynch, Richard S. Egan, Dean K. Ellison

Author Affiliations +

Proceedings Volume 1681, Optically Based Methods for Process Analysis; (1992) https://doi.org/10.1117/12.137752
Event: SPIE's 1992 Symposium on Process Control and Monitoring, 1992, Somerset, NJ, United States

Abstract

We have developed an FT-IR method, using a Spectra-Tech Monit-IR 400 systems, to monitor off-line the completion of a reaction in real-time. The reaction is moisture-sensitive and analysis by more conventional methods (normal-phase HPLC) is difficult to reproduce. The FT-IR method is based on the shift of a diazo band when a conjugated beta-diketone is transformed into a silyl enol ether during the reaction. The reaction mixture is examined directly by IR and does not require sample workup. Data acquisition time is less than one minute. The method has been validated for specificity, precision and accuracy. The results obtained by the FT-IR method for known mixtures and in-process samples compare favorably with those from a normal-phase HPLC method.

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Jhansi R. Boaz, Scott M. Thomas, Steven M. Meyerhoffer, Steven J. Staskiewicz, Joseph E. Lynch, Richard S. Egan, and Dean K. Ellison "Off-line real-time FTIR analysis of a process step in imipenem production", Proc. SPIE 1681, Optically Based Methods for Process Analysis, (14 August 1992); https://doi.org/10.1117/12.137752

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