Paper
23 November 1992 Diffuse neutron scattering signatures of rough films
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Abstract
Patterns of diffuse neutron scattering from thin films are calculated from a perturbation expansion based on the distorted-wave Born approximation. Diffuse fringes can be categorized into three main types: those that occur at constant values of the incident or scattered neutron wavevectors, and those for which the neutron wavevector transfer perpendicular to the film is constant. The variation of intensity along these fringes can be used to deduce the spectrum of surface roughness for the film and the degree of correlation between the film's rough surfaces.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Roger Pynn "Diffuse neutron scattering signatures of rough films", Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); https://doi.org/10.1117/12.130638
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Cited by 3 scholarly publications.
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KEYWORDS
Scattering

Interfaces

Optical components

Thin films

Correlation function

Reflection

Liquids

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