Paper
10 December 1992 Using moire method of measuring optical disks
Ter-Chin Cheng, Sheng-Nan Jiang, Rang-Seng Chang
Author Affiliations +
Abstract
A primary function of compact disk measuring systems is the measurement of various types of defects which represent either functional or cosmetic flaws and the measurement of the profile of the compact disk. Functional flaws can make a very bad interference with the reproduction of the recorded music. Cosmetic flaws are visual imperfections whose presence can cause the rejecting of the disc by the production line. A projection moire method is invented in which a light beam passes through a grating, and is projected onto the object by overlapping with the virtual grating in the computer software. The object's 3-dimensional profile will be reconstructed and the object's profile quality can be improved by our new method for moire image processing.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ter-Chin Cheng, Sheng-Nan Jiang, and Rang-Seng Chang "Using moire method of measuring optical disks", Proc. SPIE 1752, Current Developments in Optical Design and Optical Engineering II, (10 December 1992); https://doi.org/10.1117/12.130724
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KEYWORDS
Moire patterns

Compact discs

Photoresist materials

Optical discs

Reflectivity

Image processing

Photoresist developing

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