Paper
29 December 1992 Point-source subpixel positioning from Fourier phase-shift retrieval
Jean-Pierre Fillard, Michel Castagne, Jean-Marc Lussert
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Abstract
A new method has been recently proposed which aims at measuring the relative location of point light emitters from 2D or 3D diffraction patterns; this typical inverse problem of interpretation of the scattering field can be solved with sub-pixel accuracy. It is based on the retrieval of the Fourier phase versus frequency dependence of the calculated Optical Transfer Function of the optical system. The method is favorably compared to the classical centroid method, especially in the case of locally oscillating fields. Computer implementation is proposed which allows fast sub-pixel evaluation of the z coordinates of a collection of numerous point sources. This method applies to various situations such as robotics, precision tracking, astronomy or more specifically sub-micron ranging of nanometric sized scattering particles in a microscope field. Details are given of how to obtain significant information and how to use numerical procedures in experimental frameworks. Evaluation of the accuracy of the method and algorithms is considered.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jean-Pierre Fillard, Michel Castagne, and Jean-Marc Lussert "Point-source subpixel positioning from Fourier phase-shift retrieval", Proc. SPIE 1767, Inverse Problems in Scattering and Imaging, (29 December 1992); https://doi.org/10.1117/12.139039
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KEYWORDS
Scattering

Point spread functions

3D image processing

Particles

Inverse problems

Ranging

Diffraction

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