Paper
4 March 1993 Planetary system for high-uniformity deposited layers on large substrates
Aime Perrin, Jean-Pierre Gailliard
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Abstract
The thickness uniformity of vacuum deposited layers is a very important parameter for optical coatings. We have developed a computer program for the calculation of the uniformity as a function of the vapor distribution for planetary systems. This program shows the existence of a configuration such as the uniformity is practically independent of the vapor distribution. We give the example of an experimental system for processing four substrates of 300 mm diameter with a uniformity better than +/- 0.3% in a 1 m3 box coater.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aime Perrin and Jean-Pierre Gailliard "Planetary system for high-uniformity deposited layers on large substrates", Proc. SPIE 1782, Thin Films for Optical Systems, (4 March 1993); https://doi.org/10.1117/12.141007
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Cited by 3 scholarly publications and 1 patent.
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KEYWORDS
Planetary systems

Thin films

Clouds

Beam shaping

Camera shutters

Ions

Optical coatings

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