Paper
13 November 1980 10.6 Micrometer Interferometric Testing Of Infrared Optical Components And Aspherics
Osuk Kwon, J. C. Wyant, C. R. Hayslett
Author Affiliations +
Proceedings Volume 0190, Los Alamos Conference on Optics 1979; (1980) https://doi.org/10.1117/12.957730
Event: Los Alamos Conference on Optics '79, 1979, Los Alamos, United States
Abstract
Infrared interferometric systems using a CO2 laser operating at a wavelength of 10.6 μm are described. Specific systems discussed are a Twyman-Green interferometer and a Twyman-Green interferometer with an infrared computer-generated hologram (IRCGH). The reduced sensitivity due to the longer wavelength enables us to test optical components necessary for IP high-energy laser systems. This paper also illustrates typical results obtained from testing infrared trans litting materials, diamond-turned metal mirrors, and aspherics. Special alignment techniques and basic limitations of infrared interferometry are discussed.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Osuk Kwon, J. C. Wyant, and C. R. Hayslett "10.6 Micrometer Interferometric Testing Of Infrared Optical Components And Aspherics", Proc. SPIE 0190, Los Alamos Conference on Optics 1979, (13 November 1980); https://doi.org/10.1117/12.957730
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Infrared radiation

Interferometers

Optical components

Aspheric lenses

Mirrors

Computer generated holography

Interferometry

RELATED CONTENT

Alignment of a catadioptric infrared optical system
Proceedings of SPIE (January 09 2023)
Advances in interferometric surface measurement
Proceedings of SPIE (December 09 2005)
Interferometric Testing Of Aspheric Surfaces
Proceedings of SPIE (March 23 1987)
Design review of an infrared phase-shifting interferometer
Proceedings of SPIE (September 02 1992)

Back to Top