Properties Of An X-Ray Catoptrical System

James F. McGee

doi:10.1117/12.957791

13 November 1980 Properties Of An X-Ray Catoptrical System

James F. McGee

Proceedings Volume 0190, Los Alamos Conference on Optics 1979; (1980) https://doi.org/10.1117/12.957791
Event: Los Alamos Conference on Optics '79, 1979, Los Alamos, United States

Abstract

The need for an x-ray imaging system with better than micron resolution is increasingly evident to workers in laser fusion and general plasma diagnostics. As early as 1974, John L. Emmett of the Lawrence Livermore Laboratories in an article titled, "Shopping List for Fusion" cited the need for hardware to make measurements with micron resolution in the soft x-ray region. In the same year, KMS reported that their x-ray image of an imploding pellet, formed with a pinhole, had a resolution of only 14 microns. Laser-fusion diagnostic requirements are such that it requires viewing a small object at neither very small or very large distances. What is needed is an x-ray microscope with a large working-distance objective. For this and other reasons we favor the basic Kirkpatrick-Baez arrangement. We shall explore some of the problems and solutions associated with the formation of x-ray images at small angles of grazing incidence mainly in the crossed-mirror configuration.

Citation Download Citation

James F. McGee "Properties Of An X-Ray Catoptrical System", Proc. SPIE 0190, Los Alamos Conference on Optics 1979, (13 November 1980); https://doi.org/10.1117/12.957791

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