A Class Of High Resolution Ruggedized Fourier Transform Spectrometers

H. Buijs

doi:10.1117/12.957822

29 October 1979 A Class Of High Resolution Ruggedized Fourier Transform Spectrometers

H. Buijs

Proceedings Volume 0191, Multiplex and/or High Throughput Spectroscopy; (1979) https://doi.org/10.1117/12.957822
Event: 23rd Annual Technical Symposium, 1979, San Diego, United States

Abstract

New techniques have been developed that permit the unambiguous correction of alignment errors in a scanning Michelson interferometer by means of an electronic feedback system. This dynamic alignment system corrects not only for linearity errors in the mirror drive, but also all misalignments induced by adverse environmental conditions such as vibrations and temperature changes. Long term alignment reproducibility allows precalibration of both the spectral transmission and interferogram phase response. Phase correction of interferograms is done with a-priori phase information resulting in significantly reduced phase ambiguity in spectral regions with little intensity. Resolution to 0.01 cm-1 has been achieved in field instrumentation.

Citation Download Citation

H. Buijs "A Class Of High Resolution Ruggedized Fourier Transform Spectrometers", Proc. SPIE 0191, Multiplex and/or High Throughput Spectroscopy, (29 October 1979); https://doi.org/10.1117/12.957822

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