Paper
25 December 1979 Development Of Nomarski Microscopy For Quantitative Determination Of Surface Topography(A)
J. S. Hartman, R. L. Gordon,, D. L. Lessor
Author Affiliations +
Abstract
The use of Nomarski differential interference contrast (DIC) microscopy has been extended to provide nondestructive, quantitative analysis of a sample's surface topography. Theoretical modeling has determined the dependence of the image intensity on the micro-scope's optical components, the sample's optical properties, and the sample's surface orientation relative to the microscope. Results include expressions to allow the inversion of image intensity data to determine sample surface slopes. A commercial Nomarski system has been modified and characterized to allow the evaluation of the optical model. Data have been recorded with smooth, planar samples that verify the theoretical predictions.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. S. Hartman, R. L. Gordon,, and D. L. Lessor "Development Of Nomarski Microscopy For Quantitative Determination Of Surface Topography(A)", Proc. SPIE 0192, Interferometry, (25 December 1979); https://doi.org/10.1117/12.957861
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Cited by 2 scholarly publications.
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KEYWORDS
Prisms

Microscopes

Microscopy

Objectives

Polarizers

Phase shifts

Polarization

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