Paper
7 December 1993 Nondestructive characterization of Hg1-xCdxTe layer structures by magneto-thermoelectric measurements
Jan W. Baars, D. Brink
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Abstract
The thermoelectric properties of n-type Hg0.79Cd0.21Te (MCT) and of MCT layers with n-p-n structure were investigated in transverse magnetic fields (B (perpendicular) $DELT; 0 <EQ B <EQ 12 kG) using the lateral gradient method at temperatures between 15 K and 300 K. The experimental results were analyzed regarding the contributions of electrons and holes to the magneto-thermoelectric effect and the scattering mechanisms involved. The analysis is based on a nonparabolic conduction band and Landau quantization together with expressions for the band gap, the intrinsic carrier density, and the magnetoresistance. The magneto-thermoelectric effect was found to be a useful nondestructive tool for determining the doping and composition of the constituent layers of MCT n-p-n structures.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jan W. Baars and D. Brink "Nondestructive characterization of Hg1-xCdxTe layer structures by magneto-thermoelectric measurements", Proc. SPIE 2021, Growth and Characterization of Materials for Infrared Detectors, (7 December 1993); https://doi.org/10.1117/12.164947
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Cited by 1 scholarly publication.
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KEYWORDS
Electrons

Magnetism

Thermoelectric materials

Scattering

Temperature metrology

Nondestructive evaluation

Neodymium

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