Characterization of fractal Brownian process in laser damaged photodiodes

Woei-Yun Ho; Chun Chi Ma; Robert W. Bene; A. Bruce Buckman; Rodger M. Walser; Michael F. Becker

doi:10.1117/12.167526

1 March 1994 Characterization of fractal Brownian process in laser damaged photodiodes

Woei-Yun Ho, Chun Chi Ma, Robert W. Bene, A. Bruce Buckman, Rodger M. Walser, Michael F. Becker

Proceedings Volume 2037, Chaos/Nonlinear Dynamics: Methods and Commercialization; (1994) https://doi.org/10.1117/12.167526
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

Fractal characterization technique with spectral analysis of 1/f noise were used to study the carrier transport behavior in laser damage avalanche photodiodes. By computing correlation integral from the time series at embedding dimension M equals 2, we quantitatively characterized the random noise enhanced by laser-induced defects in laser damaged photodiodes. The lack of correlation between random noise and 1/f noise is the basis of the observation. It has been found that increasing random noise would change the characteristic features of 1/f noise spectrum. In this study, we proved that combining 1/f noise spectra, I-V curve measurements, and fractal characterization method could lead to a better understanding in the failure mechanism of laser damage to photodiodes.

Citation Download Citation

Woei-Yun Ho, Chun Chi Ma, Robert W. Bene, A. Bruce Buckman, Rodger M. Walser, and Michael F. Becker "Characterization of fractal Brownian process in laser damaged photodiodes", Proc. SPIE 2037, Chaos/Nonlinear Dynamics: Methods and Commercialization, (1 March 1994); https://doi.org/10.1117/12.167526

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