Paper
22 October 1993 Uncertainty estimation and Monte-Carlo simulation of the locating procedure of a laser 3D measuring device
Mikko Lindholm, Markku Jarviluoma, Hannu Jokinen
Author Affiliations +
Proceedings Volume 2066, Industrial Optical Sensing and Metrology: Applications and Integration; (1993) https://doi.org/10.1117/12.162098
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States
Abstract
The wear of 3D surfaces of a metallurgical vessel can be monitored with a commercial laser measuring device specially designed for this purpose. This paper describes two procedures for locating (fixing) this device, i.e., methods for finding the position and the orientation of the device with respect to the monitored vessel. The first procedure is based on strictly fitting coordinate frames on three 3D fixing points. The other procedure uses three or more points and minimizes the square sum of these distances. The locations of the fixing points in relation to the monitored surface are not affected by the wearing process. The uncertainty of the result is investigated using Monte-Carlo simulation. Random errors are included in the simulated range measurement and two orientation angles of the measuring device. The uncertainty is also estimated with linearized models of the locating procedures. The uncertainty estimation is a potential method to design the optimal on-site measurement configuration (device locations, point locations, etc.) and to improve computer algorithms for locating computations.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mikko Lindholm, Markku Jarviluoma, and Hannu Jokinen "Uncertainty estimation and Monte-Carlo simulation of the locating procedure of a laser 3D measuring device", Proc. SPIE 2066, Industrial Optical Sensing and Metrology: Applications and Integration, (22 October 1993); https://doi.org/10.1117/12.162098
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Measurement devices

Monte Carlo methods

Time metrology

Distance measurement

Instrument modeling

Metrology

Optical sensing

Back to Top