Paper
31 January 1994 Surface-enhanced Raman scattering (SERS) study of C60 and C70 in evaporated films by near-infrared FT-Raman spectroscopy
Norihisa Katayama, Yoshinori Miyatake, Yukihiro Ozaki, Koichi Kikuchi, Yohji Achiba, Isao Ikemoto, Keiji Iriyama
Author Affiliations +
Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166755
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada
Abstract
The 1064 nm excited FT-Raman spectra have been measured for thin evaporated films of C60 and C70 on metal surface. The spectral quality strongly depends upon the metal employed, the Raman scattering intensity changes with the roughness of the metal surface, and the visible excitations did not give any detectable Raman signals. These observations suggest that the spectra were subjected to surface enhanced Raman scattering (SERS) effect.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Norihisa Katayama, Yoshinori Miyatake, Yukihiro Ozaki, Koichi Kikuchi, Yohji Achiba, Isao Ikemoto, and Keiji Iriyama "Surface-enhanced Raman scattering (SERS) study of C60 and C70 in evaporated films by near-infrared FT-Raman spectroscopy", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); https://doi.org/10.1117/12.166755
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Raman spectroscopy

Metals

Raman scattering

Surface enhanced Raman spectroscopy

Glasses

Signal detection

Crystals

Back to Top