X-ray scattering signatures for material identification

Robert D. Speller; Julie A. Horrocks; Richard John Lacey

doi:10.1117/12.171256

28 March 1994 X-ray scattering signatures for material identification

Robert D. Speller, Julie A. Horrocks, Richard John Lacey

Proceedings Volume 2092, Substance Detection Systems; (1994) https://doi.org/10.1117/12.171256
Event: Substance Identification Technologies, 1993, Innsbruck, Austria

Abstract

X-ray scattering at low angles demonstrates diffraction effects that can be used to characterize materials. The effects of overlying material are shown not to affect the usefulness of the data for the identification of explosives. The important features in the scattering signature are identified.

Citation Download Citation

Robert D. Speller, Julie A. Horrocks, and Richard John Lacey "X-ray scattering signatures for material identification", Proc. SPIE 2092, Substance Detection Systems, (28 March 1994); https://doi.org/10.1117/12.171256

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