Paper
28 July 1994 Atomic force microscopy studies of laser-triggered morphology changes in Y2O3 monolayer coatings
Semyon Papernov, Ansgar W. Schmid
Author Affiliations +
Abstract
Atomic-force microscopy of pulsed and cw Nd:laser-irradiated Y2O3 monolayer coatings reveals that fluences insufficient to eject film-defect nodules are able to prompt formation of structural film features that we characterize and whose formation by linear absorption we establish. These features can be identified as precursors for conventional damage morphologies, i.e., craters.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Semyon Papernov and Ansgar W. Schmid "Atomic force microscopy studies of laser-triggered morphology changes in Y2O3 monolayer coatings", Proc. SPIE 2114, Laser-Induced Damage in Optical Materials: 1993, (28 July 1994); https://doi.org/10.1117/12.180918
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KEYWORDS
Atomic force microscopy

Laser induced damage

Absorption

Continuous wave operation

Microscopy

Dielectrics

Pulsed laser operation

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