Light scattering to characterize both faces of transparent substrates: radiative and embedded light

Didier Torricini; Claude Amra

doi:10.1117/12.192056

4 November 1994 Light scattering to characterize both faces of transparent substrates: radiative and embedded light

Didier Torricini, Claude Amra

Proceedings Volume 2253, Optical Interference Coatings; (1994) https://doi.org/10.1117/12.192056
Event: 1994 International Symposium on Optical Interference Coatings, 1994, Grenoble, France

Abstract

An alternative method is presented that allows light scattering technique to characterize both faces of transparent substrates. Experimental results are presented and the limitation of the method is investigated. In addition, a simple formulae is given to approximate the embedded scattering in the substrate, that cannot merge in air. The amount of this embedded scattering cannot be neglected in most cases.

Citation Download Citation

Didier Torricini and Claude Amra "Light scattering to characterize both faces of transparent substrates: radiative and embedded light", Proc. SPIE 2253, Optical Interference Coatings, (4 November 1994); https://doi.org/10.1117/12.192056

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