Paper
19 October 1994 Verification of molecular contaminant and atomic oxygen modeling for the Environmental Verification Experiment for the Explorer Platform (EVEEP)
Charles C. Lorentson, Laura Ottenstein, Philip T. C. Chen, Rose T. Rodriguez
Author Affiliations +
Abstract
The Environmental Verification Experiment for the Explorer Platform (EVEEP) was launched in June 1992 and is flying on an Explorer Platform along with the Extreme Ultraviolet Explorer (EUVE). EVEEP consists of five Temperature-Controlled Quartz Crystal Microbalances (TQCMs) and the necessary electronics to control the sensors and prepare the data for downlink. Two of EVEEP's TQCMs were coated with Teflon prior to flight for atomic oxygen studies. The remaining three TQCMs were not coated and are dedicated to contamination accretion studies. The two Teflon coated TQCMs were designed to give a transient demonstration of the erosion of Teflon material caused by atomic oxygen. One of the coated TQCMs is located on the shade side of the platform and experiences only atomic oxygen erosion. The other TQCM is located on the sun side of the platform and demonstrates the effects of ultraviolet radiation on the atomic oxygen erosion rate. An analysis of the erosion rates is presented for each situation emphasizing the differences between the two erosion rates. The three uncoated TQCMs measure contamination due to direct flux emitted on-orbit. This data has been used to verify current contamination modeling techniques. There is one TQCM on each side of the platform whose sole view is of the back of the nearest solar array. These arrays were painted with TW1300 white paint. Since there are two separate TQCMs with similar views, a redundant check on the modeling techniques for this configuration was possible. A comparison between the on-orbit data and the results from the analytic contamination model is presented.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Charles C. Lorentson, Laura Ottenstein, Philip T. C. Chen, and Rose T. Rodriguez "Verification of molecular contaminant and atomic oxygen modeling for the Environmental Verification Experiment for the Explorer Platform (EVEEP)", Proc. SPIE 2261, Optical System Contamination: Effects, Measurements, and Control IV, (19 October 1994); https://doi.org/10.1117/12.190159
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KEYWORDS
Space operations

Adaptive optics

Data modeling

Contamination

Oxygen

Sun

Ultraviolet radiation

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