Handheld imaging using PtSi, InSb, and HgCdTe focal plane technology

Norman B. Stetson; Joseph W. Landry

doi:10.1117/12.188664

17 October 1994 Handheld imaging using PtSi, InSb, and HgCdTe focal plane technology

Norman B. Stetson, Joseph W. Landry

Proceedings Volume 2269, Infrared Technology XX; (1994) https://doi.org/10.1117/12.188664
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

This paper presents the InfraCAM^TM concept, key components, and test results for the standard production PtSi unit. In addition it shows test results using both InSb and HgCdTe arrays as they apply to InfraCAM.

Citation Download Citation

Norman B. Stetson and Joseph W. Landry "Handheld imaging using PtSi, InSb, and HgCdTe focal plane technology", Proc. SPIE 2269, Infrared Technology XX, (17 October 1994); https://doi.org/10.1117/12.188664

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