Paper
5 August 1994 Phase shifting in shearing interferometry with double-frequency grating and semiconductor laser to measure temperature field
Hai Ming, Zhongyuan Xue, Yu Liu, Chengang Zhou, Bao Yang, Jiangping Xie, Toshinori Nakajima
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Proceedings Volume 2321, Second International Conference on Optoelectronic Science and Engineering '94; (1994) https://doi.org/10.1117/12.182184
Event: Optoelectronic Science and Engineering '94: International Conference, 1994, Beijing, China
Abstract
The shearing interferometry of phase shifting with double frequency grating and semiconductor laser is proposed. By using this technique, the experimental results of the temperature field of a heating plate are obtained and compared with those tested by a thermoelectric couple.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hai Ming, Zhongyuan Xue, Yu Liu, Chengang Zhou, Bao Yang, Jiangping Xie, and Toshinori Nakajima "Phase shifting in shearing interferometry with double-frequency grating and semiconductor laser to measure temperature field", Proc. SPIE 2321, Second International Conference on Optoelectronic Science and Engineering '94, (5 August 1994); https://doi.org/10.1117/12.182184
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Cited by 2 scholarly publications.
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