Paper
12 December 1994 Profilometry by spectral encoding of the optical axis
Herve Perrin, Patrick Sandoz, Gilbert M. Tribillon
Author Affiliations +
Abstract
A scanning optical profilometer without sample displacement along the optical axis has been developed. Light coming from a wide spectrum light source is focused onto the inspected surface through a Fresnel lens. Because of its dispersive properties, the foci are distributed along the optical axis as a function of wavelength. The reflected light is focused on a filtering pinhole like in confocal microscopy. The only wavelength exactly focused on the surface is transferred through this pinhole to the detection unit. The detected light is analyzed through a spectroscopic device and the surface height is deduced from the wavelength for which the light intensity is maximum. This punctual measure is repeated for each surface point by a lateral scanning of the surface. With respect to other focus sensing profilers, we replace a mechanical z displacement of the sample by a spectral inspection of the detected light. The setup and some experimental results are presented.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Herve Perrin, Patrick Sandoz, and Gilbert M. Tribillon "Profilometry by spectral encoding of the optical axis", Proc. SPIE 2340, Interferometry '94: New Techniques and Analysis in Optical Measurements, (12 December 1994); https://doi.org/10.1117/12.195933
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Fresnel lenses

Objectives

Light sources

Confocal microscopy

Computer programming

Inspection

Mirrors

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