Angular Measurement Uncertainty For An Infrared (IR) Sensor

V. V. Vaughn; E. L. Bosworth; D. D. Dudley

doi:10.1117/12.959586

23 December 1980 Angular Measurement Uncertainty For An Infrared (IR) Sensor

V. V. Vaughn, E. L. Bosworth, D. D. Dudley

Proceedings Volume 0256, Infrared Systems; (1980) https://doi.org/10.1117/12.959586
Event: 1980 Huntsville Technical Symposium, 1980, Huntsville, United States

Abstract

The angular measurement uncertainty of an infrared (IR) sensor has been determined for expected signal waveforms and associated data processing algorithms. The problem was formulated by using the visibility factor and calculating its interaction with the characteristics of the leading edge (LE) and peak detection (PD) processing algorithms. Functional forms of the measurement uncertainty for both the scan and cross-scan directions are presented using rectangular and Gaussian signal waveforms. The relative merits of the LE and PD algorithms are discussed, and the measurement variations between rectangular and Gaussian input signal waveforms are compared.

Citation Download Citation

V. V. Vaughn, E. L. Bosworth, and D. D. Dudley "Angular Measurement Uncertainty For An Infrared (IR) Sensor", Proc. SPIE 0256, Infrared Systems, (23 December 1980); https://doi.org/10.1117/12.959586

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