Determination of profile parameters of planar waveguides

Dmitry V. Svistunov

doi:10.1117/12.226169

3 November 1995 Determination of profile parameters of planar waveguides

Dmitry V. Svistunov

Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226169
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine

Abstract

The simple nondestructive method for reconstruction of the refractive index distribution in the waveguide cross section is presented. Sample surface immersing and the interferometric method of registration are utilized in this technique.

Citation Download Citation

Dmitry V. Svistunov "Determination of profile parameters of planar waveguides", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); https://doi.org/10.1117/12.226169

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