Paper
3 November 1995 Quantum-well-laser mirror degradation investigated by microprobe optical spectroscopy
C. Corvasce, Vincenzo Spagnolo, Gaetano Scamarcio, M. Lugara, F. Adduci, Michele Ferrara, Michele Sibilano, Sergio Pellegrino, Massimo del Giudice, M. G. Re
Author Affiliations +
Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226195
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine
Abstract
A study of facet degradation of InGaAs quantum well lasers is reported. We tune up a Raman and photoluminescence micro-probe technique for determining the crystal structure and the temperature profile of the cladding layer, in steps of approximately 1 micrometer, with a temperature resolution better than 1 degree Kelvin. The cladding layer composition and cross- section temperature profile have been monitored during operation. A clear correlation between the facet degradation and the type of protective coating is found.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. Corvasce, Vincenzo Spagnolo, Gaetano Scamarcio, M. Lugara, F. Adduci, Michele Ferrara, Michele Sibilano, Sergio Pellegrino, Massimo del Giudice, and M. G. Re "Quantum-well-laser mirror degradation investigated by microprobe optical spectroscopy", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); https://doi.org/10.1117/12.226195
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KEYWORDS
Cladding

Semiconductor lasers

Raman spectroscopy

Crystals

Diodes

Gallium arsenide

Mirrors

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