Scientific CMOS CID imagers

Jeffrey J. Zarnowski; Joseph Carbone; Matthew A. Pace

doi:10.1117/12.236116

25 March 1996 Scientific CMOS CID imagers

Jeffrey J. Zarnowski, Joseph Carbone, Matthew A. Pace

Proceedings Volume 2654, Solid State Sensor Arrays and CCD Cameras; (1996) https://doi.org/10.1117/12.236116
Event: Electronic Imaging: Science and Technology, 1996, San Jose, CA, United States

Abstract

A new family of binary format CMOS CID imagers was designed to meet the random pixel addressing and on-chip signal manipulation requirements of may scientific applications. Key features include true random pixel and programmable subarray addressing, non-destructive readout and charge injection (clearing) that eliminate the need to read out superfluous pixels. And, programmable horizontal/vertical binning provides improved signal/noise and permits spatial signal consolidation even when reading out overlapping subarrays. The imagers incorporate on-chip preamplifiers for low noise readout. Inherent CID pixel characteristics such as non-destructive, non-blooming read-out that permit adaptive exposure control and linear dynamic range extension are maintained. Formats include 1024², 512², and 1024 X 256. All incorporate 27.0 micron contiguous square pixels with in excess of 10⁶ electron well capacity. Serial horizontal and vertical input ports are provided to accept the coordinates of the pixel or subarray to be readout. Rapid subarray readout is facilitated via a single pixel advance clock that is used in conjunction with each random access decoder. A description of the architecture, imager operation and application will be presented.

Citation Download Citation

Jeffrey J. Zarnowski, Joseph Carbone, and Matthew A. Pace "Scientific CMOS CID imagers", Proc. SPIE 2654, Solid State Sensor Arrays and CCD Cameras, (25 March 1996); https://doi.org/10.1117/12.236116

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