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The atomic force microscope (AFM) is a very sensitive instrument to examine the topography of surfaces and their properties. The sensitivity of the AFM depends on the choice of the detector system, which is used to observe the cantilever deflection. A cantilever with integrated Wheatstone piezoresistive bridge as a deflection sensor was used in experiments. We describe noise properties of the piezoresistive Wheatstone bridge cantilever and show examples of topography measurements in contact and noncontact mode.
Teodor Gotszalk,R. Linnemann,Ivo W. Rangelow,Piotr Dumania, andPiotr B. Grabiec
"AFM with piezoresistive Wheatstone bridge cantilever: noise performance and applications in contact and noncontact mode", Proc. SPIE 2780, Metal/Nonmetal Microsystems: Physics, Technology, and Applications, (8 April 1996); https://doi.org/10.1117/12.238192
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Teodor Gotszalk, R. Linnemann, Ivo W. Rangelow, Piotr Dumania, Piotr B. Grabiec, "AFM with piezoresistive Wheatstone bridge cantilever: noise performance and applications in contact and noncontact mode," Proc. SPIE 2780, Metal/Nonmetal Microsystems: Physics, Technology, and Applications, (8 April 1996); https://doi.org/10.1117/12.238192