Paper
8 April 1996 AFM with piezoresistive Wheatstone bridge cantilever: noise performance and applications in contact and noncontact mode
Teodor Gotszalk, R. Linnemann, Ivo W. Rangelow, Piotr Dumania, Piotr B. Grabiec
Author Affiliations +
Proceedings Volume 2780, Metal/Nonmetal Microsystems: Physics, Technology, and Applications; (1996) https://doi.org/10.1117/12.238192
Event: Metal/Nonmetal Microsystems: Physics, Technology, and Applications, 1995, Polanica Zdroj, Poland
Abstract
The atomic force microscope (AFM) is a very sensitive instrument to examine the topography of surfaces and their properties. The sensitivity of the AFM depends on the choice of the detector system, which is used to observe the cantilever deflection. A cantilever with integrated Wheatstone piezoresistive bridge as a deflection sensor was used in experiments. We describe noise properties of the piezoresistive Wheatstone bridge cantilever and show examples of topography measurements in contact and noncontact mode.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Teodor Gotszalk, R. Linnemann, Ivo W. Rangelow, Piotr Dumania, and Piotr B. Grabiec "AFM with piezoresistive Wheatstone bridge cantilever: noise performance and applications in contact and noncontact mode", Proc. SPIE 2780, Metal/Nonmetal Microsystems: Physics, Technology, and Applications, (8 April 1996); https://doi.org/10.1117/12.238192
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Cited by 11 scholarly publications.
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