Near-field study of magneto-optical samples: theoretical comparison of transversal and polar effects

Daniel Van Labeke; A. Vial; Dominique Barchiesi

doi:10.1117/12.250786

18 September 1996 Near-field study of magneto-optical samples: theoretical comparison of transversal and polar effects

Daniel Van Labeke, A. Vial, Dominique Barchiesi

Proceedings Volume 2782, Optical Inspection and Micromeasurements; (1996) https://doi.org/10.1117/12.250786
Event: Lasers, Optics, and Vision for Productivity in Manufacturing I, 1996, Besancon, France

Abstract

The density of integration of magneto-optical devices is limited by diffraction of light. Recently some groups have proposed to use Near-Field Microscopy to overcome this limitation and some experiments have been performed both in transmission and reflection. In this paper we study theoretically magneto-optical effect in near-field. We consider a magneto-optical sample with details smaller than the wavelength. This sample is modelled as a multilayer rough structure. At least one layer has magneto-optical properties. The corrugation at the interfaces are very small compared to the optical wavelength. We do not consider the writing problem and the experiment is only modelled in the reading mode. Moreover, the magnetic properties are considered in the saturation regime. For this study we use an extension of the method that we used to describe near- field microscope with isotropic sample. The diffracted fields are determined in each layer by using a perturbative version of the Rayleigh method which leads to the resolution of a linear equation for each diffracted wave. The near- field above the sample is thus obtained by summing all the diffracted waves. We consider two geometries for the magnetization: polar effect where the magnetization is perpendicular to the sample and transversal effect where it is in the plane. We compare near-field images obtained in transmission and reflection by changing magnetization orientation. Comparisons with far-field results are also proposed.

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Daniel Van Labeke, A. Vial, and Dominique Barchiesi "Near-field study of magneto-optical samples: theoretical comparison of transversal and polar effects", Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); https://doi.org/10.1117/12.250786

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KEYWORDS

Near field

Diffraction

Interfaces

Magnetism

Microscopes

Microscopy

Near field optics

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