X-ray diffraction analysis of some single crystals with special properties

Mikhail Yu. Antipin

doi:10.1117/12.244317

12 July 1996 X-ray diffraction analysis of some single crystals with special properties

Mikhail Yu. Antipin

Proceedings Volume 2809, Space Processing of Materials; (1996) https://doi.org/10.1117/12.244317
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

New possibilities of the x-ray diffraction method for studies of some single crystals with special physical properties are analyzed. It is demonstrated that wide range temperature diffraction data, special single crystals experiments under strong electric fields, and charge density analysis in crystals might enrich our knowledge on the nature of the crystal properties.

Citation Download Citation

Mikhail Yu. Antipin "X-ray diffraction analysis of some single crystals with special properties", Proc. SPIE 2809, Space Processing of Materials, (12 July 1996); https://doi.org/10.1117/12.244317

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