Optical property study of phase change optical recording thin film media

Yanwu Lu; Ailun Rong

doi:10.1117/12.251986

20 September 1996 Optical property study of phase change optical recording thin film media

Yanwu Lu, Ailun Rong

Proceedings Volume 2890, Optical Recording, Storage, and Retrieval Systems; (1996) https://doi.org/10.1117/12.251986
Event: Photonics China '96, 1996, Beijing, China

Abstract

Room temperature reflectivity measurement over the energy 0.7eV to 7eV has been made on the phase change recording thin film based on Ge-Sb-Te alloy. The reflectivity curves have been obtained by spectrophotometer. An analysis of reflectivity curves for this recording medium has been made by use of Kramers-Kronig (KK) relation. The refraction index n($omaga) have been obtained as a n energy function. The optical gaps of the recording medium are 0.71eV in glassy state and 1.32eV in crystalline state. The research results show that this recording medium can be used as a phase change optical storage material in short wavelength range. This paper provides a research method by use of KK relation to obtain optical properties of recording thin film, and gives a practical application of this phase change recording medium in short wavelength range and high density storage.

Citation Download Citation

Yanwu Lu and Ailun Rong "Optical property study of phase change optical recording thin film media", Proc. SPIE 2890, Optical Recording, Storage, and Retrieval Systems, (20 September 1996); https://doi.org/10.1117/12.251986

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