Paper
31 October 1996 Optical system for real-time web-process defect inspection
Author Affiliations +
Abstract
The results of a program to develop a low-cost, real-time approach for 100 percent inspection of fast-moving process lines for textures, paper, and steel are reported. Initial results will be described of a laser based scanning system that uses a neural network for training and the implementation of a neural network with an optical processor for real-time defect inspection.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James S. Harris "Optical system for real-time web-process defect inspection", Proc. SPIE 2908, Machine Vision Applications, Architectures, and Systems Integration V, (31 October 1996); https://doi.org/10.1117/12.257267
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CITATIONS
Cited by 6 scholarly publications.
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KEYWORDS
LCDs

Neural networks

Chemical elements

Defect inspection

Inspection

Optical components

Light scattering

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