Paper
7 July 1997 Stability of glass probe tips for critical dimension measurement
Joseph E. Griffith, Gabriel L. Miller, Leslie C. Hopkins, Charles E. Bryson III, E. J. Snyder, J. J. Plombon, Leonid A. Vasilyev, Jeffery B. Bindell
Author Affiliations +
Abstract
One of the fundamental requirements for reliable critical dimension measurement with a scanning probe microscope is stability of the stylus against flexing and against erosion. We report on the wear of an etched optical fiber when scanned across a variety of surfaces. The optical fiber probe tip was used in a novel scanning probe microscope employing a balance beam force sensor.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joseph E. Griffith, Gabriel L. Miller, Leslie C. Hopkins, Charles E. Bryson III, E. J. Snyder, J. J. Plombon, Leonid A. Vasilyev, and Jeffery B. Bindell "Stability of glass probe tips for critical dimension measurement", Proc. SPIE 3050, Metrology, Inspection, and Process Control for Microlithography XI, (7 July 1997); https://doi.org/10.1117/12.275932
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KEYWORDS
Sensors

Glasses

Microscopes

Capacitors

Silicon

Optical fibers

Scanning probe microscopes

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