Paper
1 April 1997 Determination of anisotropic film thickness, complex reflective indices, and their dispersion from reflectance spectra
Valery N. Filippov, Vitaly P. Kutavichus
Author Affiliations +
Proceedings Volume 3094, Polarimetry and Ellipsometry; (1997) https://doi.org/10.1117/12.271838
Event: Polarimetry and Ellipsometry, 1996, Kazimierz Dolny, Poland
Abstract
The method of envelopes and based on reflectance measurements only, is developed for investigation of uniaxial absorbing films formed on absorbing substrates. Two optical axis orientations parallel and perpendicular to the film interfaces are analyzed. Reflectance spectra for p and s linear polarizations are used to determine the complex dielectric constants of the film Eo ((lambda) ) and Ee ((lambda) ) and its thickness. For the transparent films the analytical solutions are obtained for these parameters. The simple iterative procedure are used for their determination in the case of absorbing films. Numerical model calculations are carried out to study the characteristics of the method developed. They show high stability of the real parts of Eo and h determination to the measurement error.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Valery N. Filippov and Vitaly P. Kutavichus "Determination of anisotropic film thickness, complex reflective indices, and their dispersion from reflectance spectra", Proc. SPIE 3094, Polarimetry and Ellipsometry, (1 April 1997); https://doi.org/10.1117/12.271838
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