Errors in x-ray intensity measurements by means of 2D position-sensitive detector

Andrzej Wasiak; Pawel Sajkiewicz

doi:10.1117/12.267187

18 February 1997 Errors in x-ray intensity measurements by means of 2D position-sensitive detector

Andrzej Wasiak, Pawel Sajkiewicz

Proceedings Volume 3095, X-Ray Investigations of Polymer Structures; (1997) https://doi.org/10.1117/12.267187
Event: X-Ray Investigations of Polymer Structures, 1996, Bielsko-Biala, Poland

Abstract

The aim of the present work is determination of characteristic of the 2D position sensitive detector in order to establish conditions, limitations and corrections needed for quantitative measurements of the intensity of scattered X-ray radiation. The analysis of the possibility to introduce corrections of nonuniformities in sensitivity of the detector along its surface, being responsible for distortions in the measured intensity profiles.

Citation Download Citation

Andrzej Wasiak and Pawel Sajkiewicz "Errors in x-ray intensity measurements by means of 2D position-sensitive detector", Proc. SPIE 3095, X-Ray Investigations of Polymer Structures, (18 February 1997); https://doi.org/10.1117/12.267187

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