Metrology laboratory requirements for third-generation synchrotron radiation sources

Peter Z. Takacs; Shinan Qian

doi:10.1117/12.295555

1 November 1997 Metrology laboratory requirements for third-generation synchrotron radiation sources

Peter Z. Takacs, Shinan Qian

Proceedings Volume 3152, Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors; (1997) https://doi.org/10.1117/12.295555
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

New third-generation synchrotron radiation sources that are now, or will soon, come on line will need to decide how to handle the testing of optical components delivered for use in their beam lines. In many cases it is desirable to establish an in-house metrology laboratory to do the work. We review the history behind the formation of the Optical Metrology Laboratory at Brookhaven National Laboratory and the rationale for its continued existence. We offer suggestions to those who may be contemplating setting up similar facilities, based on our experiences over the past two decades.

Citation Download Citation

Peter Z. Takacs and Shinan Qian "Metrology laboratory requirements for third-generation synchrotron radiation sources", Proc. SPIE 3152, Materials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors, (1 November 1997); https://doi.org/10.1117/12.295555

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