Paper
25 September 1997 Arbitrary order aberrations for elements characterized by measured fields
Kyoko Makino, Martin Berz
Author Affiliations +
Abstract
The precise understanding of the properties of large acceptance devices like modern nuclear spectrographs often requires the calculation of high-order aberrations. In many practical cases, it is necessary to treat all details of the fields of the elements, and instead of utilizing more or less simple field models, one has to rely on measured data. It is shown how aberrations of in principle unlimited orders can be obtained from measured field data; moreover, for the remaining aberrations of yet higher order, rigorous upper bounds of their influence on the motion can be found. The methods are used for the analysis and correction of the high-resolution S800 spectrograph at MSU.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kyoko Makino and Martin Berz "Arbitrary order aberrations for elements characterized by measured fields", Proc. SPIE 3155, Charged Particle Optics III, (25 September 1997); https://doi.org/10.1117/12.287813
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Cited by 5 scholarly publications.
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KEYWORDS
Spectrographs

Wavelets

Particles

Data modeling

Information operations

Motion models

Superconductors

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