Paper
5 September 1997 Improved meshing technique and its application in the analysis of large and complex MEMS systems
Yie He, James Marchetti, Fariborz Maseeh
Author Affiliations +
Proceedings Volume 3224, Micromachined Devices and Components III; (1997) https://doi.org/10.1117/12.284521
Event: Micromachining and Microfabrication, 1997, Austin, TX, United States
Abstract
This paper presents a new local refining meshing algorithm which is referred to as the exposed face mesh (EFM) algorithm, for 3D coupled electromechanical analysis with multiple dielectrics. This algorithm allows for the independent refinement of the electrostatic mesh and mechanical mesh in a coupled system. This approach is compared to the commonly used volume refining mesh method in which both the electrostatic and mechanical mesh domains are refined concurrently. The new EFM method is shown to have substantial improvement in increasing accuracy of results and reducing computational expense especially for fringe electric field dominated structures. For a typical comb drive structure, the EFM algorithm generates much fewer volume mesh nodes for mechanical analysis and fewer surface mesh panels for electrostatic analysis than the standard volume refining mesh method. At the same time, the EFM method showed an improvement in accuracy from 15 percent to within 5 percent for this case. The IntelliCAD MEMS modeling software has incorporated this EFM algorithm and made it a unique software system to handle general device structures accurately.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yie He, James Marchetti, and Fariborz Maseeh "Improved meshing technique and its application in the analysis of large and complex MEMS systems", Proc. SPIE 3224, Micromachined Devices and Components III, (5 September 1997); https://doi.org/10.1117/12.284521
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CITATIONS
Cited by 5 scholarly publications.
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KEYWORDS
Microelectromechanical systems

Complex systems

Dielectrics

Instrument modeling

Systems modeling

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