Paper
5 June 1998 Modeling study of image formation with point sources
Srinivas B. Bollepalli, Mumit Khan, Franco Cerrina
Author Affiliations +
Abstract
It is well known that a point source produces a small magnification of the mask pattern on the wafer due to divergence; the effect becomes especially noticeable at the corners and edges of the field. In this article we model the image formation due to a point source and compare the deviations of the aerial images and developed patterns, from those at the center of the field. We illustrate the behavior with several computational results.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Srinivas B. Bollepalli, Mumit Khan, and Franco Cerrina "Modeling study of image formation with point sources", Proc. SPIE 3331, Emerging Lithographic Technologies II, (5 June 1998); https://doi.org/10.1117/12.309569
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Cited by 1 scholarly publication.
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KEYWORDS
Image acquisition

Photomasks

Wave propagation

Collimation

Convolution

Image filtering

Nanolithography

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