Refinements in practical accuracy factors for resistor-array IR scene projectors

Alan P. Pritchard; Mark A. Venables; Stephen Paul Lake; David W. Gough

doi:10.1117/12.316390

13 July 1998 Refinements in practical accuracy factors for resistor-array IR scene projectors

Alan P. Pritchard, Mark A. Venables, Stephen Paul Lake, David W. Gough

Proceedings Volume 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III; (1998) https://doi.org/10.1117/12.316390
Event: Aerospace/Defense Sensing and Controls, 1998, Orlando, FL, United States

Abstract

We describe incremental improvements in measurement, understanding and control of sensor-perceived scene accuracy factors for BAe resistor-array IR scene projector devices by means of system and device design, analysis and measurement methodology. Progress has been made in the areas of fill- factor measurement, aliasing effects, dead pixel statistics, image spreading, the design of non-uniformity correction (NUC) systems, busbar robbing, heatsink effects and noise sources.

Citation Download Citation

Alan P. Pritchard, Mark A. Venables, Stephen Paul Lake, and David W. Gough "Refinements in practical accuracy factors for resistor-array IR scene projectors", Proc. SPIE 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III, (13 July 1998); https://doi.org/10.1117/12.316390

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