Characterization of ion-exchanged waveguides from near-field measurements

Daniel Pircalaboiu; Gabriella Motta; Guido Perrone; Ivo Montrosset

doi:10.1117/12.312678

2 July 1998 Characterization of ion-exchanged waveguides from near-field measurements

Daniel Pircalaboiu, Gabriella Motta, Guido Perrone, Ivo Montrosset

Proceedings Volume 3405, ROMOPTO '97: Fifth Conference on Optics; (1998) https://doi.org/10.1117/12.312678
Event: ROMOPTO '97: Fifth Conference on Optics, 1997, Bucharest, Romania

Abstract

The refractive index distribution is a key parameter not only to characterize the technological process but also for any integrated optical simulator. In this paper we propose a new algorithm to reconstruct the refractive index profile from the near-field measurements. The technique is based on the matching of the measured intensity profile with a computed one, varying the maximum index change and the diffusion depth.

Citation Download Citation

Daniel Pircalaboiu, Gabriella Motta, Guido Perrone, and Ivo Montrosset "Characterization of ion-exchanged waveguides from near-field measurements", Proc. SPIE 3405, ROMOPTO '97: Fifth Conference on Optics, (2 July 1998); https://doi.org/10.1117/12.312678

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