New method of measuring CCD device photoresponse nonuniformity

Fu Wang; XueJu Shen; Weigang Chen; Xinhua Sun; Wei Dong; Bing Zhou

doi:10.1117/12.318088

11 August 1998 New method of measuring CCD device photoresponse nonuniformity

Fu Wang, XueJu Shen, Weigang Chen, Xinhua Sun, Wei Dong, Bing Zhou

Proceedings Volume 3553, Detectors, Focal Plane Arrays, and Imaging Devices II; (1998) https://doi.org/10.1117/12.318088
Event: Photonics China '98, 1998, Beijing, China

Abstract

A new method of measuring the PRN of CCD device is presented the PRN of CCD device can be determined quickly and accurately by this method, the effect of illuminance distribution nonuniformity on the measurement of CCD device PRN is eliminated.

Citation Download Citation

Fu Wang, XueJu Shen, Weigang Chen, Xinhua Sun, Wei Dong, and Bing Zhou "New method of measuring CCD device photoresponse nonuniformity", Proc. SPIE 3553, Detectors, Focal Plane Arrays, and Imaging Devices II, (11 August 1998); https://doi.org/10.1117/12.318088

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