Paper
17 June 1999 Surface potential imaging of organic and biological samples by using scanning Maxwell-stress microscopy (SMM)
Yoshiki Hirata, Fumio Mizutani, Hiroshi Yokoyama
Author Affiliations +
Proceedings Volume 3607, Scanning and Force Microscopies for Biomedical Applications; (1999) https://doi.org/10.1117/12.350623
Event: BiOS '99 International Biomedical Optics Symposium, 1999, San Jose, CA, United States
Abstract
Surface potential measurement on organic thin films and isolated biological samples have been performed using a scanning Maxwell-stress microscopy (SMM). The SMM is a type of scanning probe microscopy designed to image microscopic electrical properties, such as the local surface potential distribution. The present microscope afforded information of the lateral distribution of molecular dipole moments in phase separated monolayer, and the topographic image of purple membrane fragments as well as dielectric properties of samples.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yoshiki Hirata, Fumio Mizutani, and Hiroshi Yokoyama "Surface potential imaging of organic and biological samples by using scanning Maxwell-stress microscopy (SMM)", Proc. SPIE 3607, Scanning and Force Microscopies for Biomedical Applications, (17 June 1999); https://doi.org/10.1117/12.350623
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KEYWORDS
Phase modulation

Microscopy

Natural surfaces

Thin films

Absorption

Dielectrics

Silicon

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