Two practical ways to avoid spurious reflections from shiny surfaces on a 3D machine vision inspection system

Daoshan Yang; Jihong Chen; Huicheng Zhou; Shawn Buckley

doi:10.1117/12.341150

8 March 1999 Two practical ways to avoid spurious reflections from shiny surfaces on a 3D machine vision inspection system

Daoshan Yang, Jihong Chen, Huicheng Zhou, Shawn Buckley

Author Affiliations +

Proceedings Volume 3652, Machine Vision Applications in Industrial Inspection VII; (1999) https://doi.org/10.1117/12.341150
Event: Electronic Imaging '99, 1999, San Jose, CA, United States

Abstract

Spurious reflection from shiny surfaces is one of the major problems in machine vision inspection systems based on triangulation of structured light. To investigate this problem, a non-contact real-time 3D machine vision inspection prototype is described. Its accuracy is +/- 2 micrometers using a structured laser light sheet imaged by a machine vision camera. To avoid the spurious reflections from shiny surfaces, two methods are investigated. In the first method, the object is scanned off-line, finding the 3- space locations of the object's surface points using standard triangulation algorithms. Next the object's surfaces are reconstructed, breaking the surfaces into various simple feature primitives such as planes, cylinders, cones and spheres. The influence of spurious reflections from shiny surfaces is eliminated by deleting those points that do not fall on the reconstructed surfaces. In the second method, a 3D datacloud density method is employed. The datacloud density of a 3D point is the number of measured points in the close vicinity of that point. Since a spurious point's datacloud density is generally lower than a correct point lying on the part's surface, the spurious points can be identified and deleted.

Citation Download Citation

Daoshan Yang, Jihong Chen, Huicheng Zhou, and Shawn Buckley "Two practical ways to avoid spurious reflections from shiny surfaces on a 3D machine vision inspection system", Proc. SPIE 3652, Machine Vision Applications in Industrial Inspection VII, (8 March 1999); https://doi.org/10.1117/12.341150

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available