Paper
25 June 1999 EUCLIDES: the European EUVL program
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Abstract
A new European research program named EUCLIDES (Extreme UV Concept Lithography Development System) has been started in August 1998. The program headed by ASM Lithography (ASML), partnered by Carl Zeiss and Oxford Instruments, is evaluating EUVL as a viable lithographic solution for resolutions of 70 nm and below. This paper gives an overview of program objectives and status, including a summary of recent highlights.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jozef P. H. Benschop, Winfried M. Kaiser, and David C. Ockwell "EUCLIDES: the European EUVL program", Proc. SPIE 3676, Emerging Lithographic Technologies III, (25 June 1999); https://doi.org/10.1117/12.351165
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Cited by 9 scholarly publications.
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KEYWORDS
Extreme ultraviolet lithography

Extreme ultraviolet

Lithography

Synchrotrons

Mirrors

Optical lithography

EUV optics

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