Paper
10 March 1999 Effects of capacitors, resistors, and residual charges on the static and dynamic performance of electrostatically actuated devices
Edward K. Chan, Robert W. Dutton
Author Affiliations +
Proceedings Volume 3680, Design, Test, and Microfabrication of MEMS and MOEMS; (1999) https://doi.org/10.1117/12.341276
Event: Design, Test, and Microfabrication of MEMS/MOEMS, 1999, Paris, France
Abstract
The important practical and realistic design issues of an electrostatic actuator/positioner with full-gap travel are discussed. Analytic expressions and numerical simulations show that parasitic capacitances, and non-uniform deformation in two and three dimensions influence the range of travel of an electrostatic positioner stabilized by the addition of a series capacitor. The effects of residual charge on electrostatically-actuated devices are described. The dynamic stepping characteristics of the positioner under compressible squeeze-film damping and resistive damping are compared. The physical descriptions of devices being fabricated in the MUMPs process are presented along with 3D simulation results that demonstrate viability.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Edward K. Chan and Robert W. Dutton "Effects of capacitors, resistors, and residual charges on the static and dynamic performance of electrostatically actuated devices", Proc. SPIE 3680, Design, Test, and Microfabrication of MEMS and MOEMS, (10 March 1999); https://doi.org/10.1117/12.341276
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Cited by 24 scholarly publications and 2 patents.
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KEYWORDS
Electrodes

Capacitors

Actuators

Capacitance

Dielectrics

Resistors

Computer aided design

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