Birefringence measurement by scattered light method with a phase-shifting technique

Norihiro Umeda; Jun Takahashi; Daisuke Iiduka; Hiroyuki Kohwa

doi:10.1117/12.347713

7 May 1999 Birefringence measurement by scattered light method with a phase-shifting technique

Norihiro Umeda, Jun Takahashi, Daisuke Iiduka, Hiroyuki Kohwa

Proceedings Volume 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99); (1999) https://doi.org/10.1117/12.347713
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '99), 1999, Yokohama, Japan

Abstract

This paper describes a modified birefringence measurement using the scattered light method combined with a phase shifting technique. A phase shift between orthogonal linear polarization components is realized by a retardation compensator. The measured distribution has a periodical error, which can be reduced by a band pass filtering of the Fourier spectrum of scattered light distribution. This method enables a birefringence distribution on a light path to be obtained.

Citation Download Citation

Norihiro Umeda, Jun Takahashi, Daisuke Iiduka, and Hiroyuki Kohwa "Birefringence measurement by scattered light method with a phase-shifting technique", Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); https://doi.org/10.1117/12.347713

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