Comparison of the radiation damage induced by thermal neutrons in CdTe and CdZnTe detectors

Piero L. Chirco; MariaPia Morigi; Martina Zanarini; Anna D.M. Cavallini; B. Fraboni; Natalia Auricchio; Ezio Caroli; Waldes Dusi; Paul Fougeres; Makram Hage-Ali; Paul Siffert

doi:10.1117/12.366609

19 October 1999 Comparison of the radiation damage induced by thermal neutrons in CdTe and CdZnTe detectors

Piero L. Chirco, MariaPia Morigi, Martina Zanarini, Anna D.M. Cavallini, B. Fraboni, Natalia Auricchio, Ezio Caroli, Waldes Dusi, Paul Fougeres, Makram Hage-Ali, Paul Siffert

Author Affiliations +

Proceedings Volume 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics; (1999) https://doi.org/10.1117/12.366609
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

In recent years, room temperature semiconductor detectors like CdTe and CdZnTe have been proposed for several scientific, industrial and medical applications. In some cases, these applications require the capability to operate for a long time in intense, sometimes mixed, radiation fields while retaining full spectroscopic performances. In spite of its importance, a detailed characterization of the effects of the radiation damage has not been competed yet for these materials. However, preliminary results carried out by irradiating CdTe detectors with ⁶⁰Co gamma rays demonstrated that the fatal photon dose is on the order of some tens of thousands Gy, while the detectors are rather insensitive to doses up to few thousands Gy. A wider activity is now being performed by the authors studying both the CdTe and the CdZnTe when involving several types of irradiating sources and different techniques to quantify the induced damaging. This includes the detailed quantitative analysis of retained spectroscopic performances at low and medium energies, the measurement of the dark current and the characterization of the defects and modifications induced in the structure of the crystal by the irradiation process.

Citation Download Citation

Piero L. Chirco, MariaPia Morigi, Martina Zanarini, Anna D.M. Cavallini, B. Fraboni, Natalia Auricchio, Ezio Caroli, Waldes Dusi, Paul Fougeres, Makram Hage-Ali, and Paul Siffert "Comparison of the radiation damage induced by thermal neutrons in CdTe and CdZnTe detectors", Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); https://doi.org/10.1117/12.366609

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available