Polarization models for Monte Carlo ray tracing

Edward R. Freniere; G. Groot Gregory; Richard A. Hassler

doi:10.1117/12.363772

27 September 1999 Polarization models for Monte Carlo ray tracing

Edward R. Freniere, G. Groot Gregory, Richard A. Hassler

Proceedings Volume 3780, Optical Design and Analysis Software; (1999) https://doi.org/10.1117/12.363772
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

In many optical systems, the polarization state of light is of critical importance and must be considered during their design. In other systems, the polarization state is used and manipulated as an integral part of the design. Three methods exist for modeling the polarization state of light: the Mueller calculus; the Jones calculus; and the polarization ray tracing calculus. The relative advances of these methods for simulating the polarization behavior of real devices using Monte Carlo ray tracing software is discussed, including simulation of the polarization properties of scattered light.

Citation Download Citation

Edward R. Freniere, G. Groot Gregory, and Richard A. Hassler "Polarization models for Monte Carlo ray tracing", Proc. SPIE 3780, Optical Design and Analysis Software, (27 September 1999); https://doi.org/10.1117/12.363772

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